Title: Integrated verification ecosystem for regression management, coverage convergence, and debug automation

Speaker: William Huang, Synopsys

Abstract: To speed up turnaround time of verification flow, various EDA tools have been introduced to automate and accelerate different aspects in the flow, including regression management, coverage optimizer for saturation and diversity, coverage hole analysis, automatic binning of failure cases, and root cause prediction and analysis.

Although each tool handles its respective field well, they can be further integrated to construct a comprehensive verification automation ecosystem by automatic connection and data utilization between tools. In this paper, we’ll introduce how the proposed verification automation ecosystem can facilitate user’s daily tasks in the verification flow.